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[EN 201910720478.4] Apparatus and method for detecting faults in mechanical presses


[CN 201910720478.4] Equipment and method for detecting faults in mechanical presses Title: Equipment and method for detecting faults in mechanical presses Application number: CN 201910720478.4 Applicant: Advanced Technology Singapore Co., Ltd. Application date: 2019-8-6 Patent type: Invention application The present invention provides an apparatus and method for detecting faults in a press for stamping semiconductor components, wherein the method includes the following steps: A semiconductor element is positioned between a first die set portion and a second die set portion included in the press; and the first die set portion and the second die set portion are moved relative to each other to stamp the semiconductor element therebetween. The method further includes the step of monitoring parameters at different locations of the first mold set portion with sensors attached to the first mold set portion and/or the second mold set portion while the first mold set portion is moved relative to the second mold set portion while the semiconductor element is being stamped; and comparing a current change in the parameter at a different position of the first die set portion relative to the second die set portion with an expected change in the parameter at a position of the first die set portion relative to the second die set portion during normal operation of the press when there is no failure while stamping the semiconductor element. The method further comprises the step of determining that a fault has occurred in the press when the current change in the parameter is different from the expected change in the parameter.